[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - The physical mechanism investigation of off-state drain bias TDDB and its implication in advance HK/MG FinFETs
Chen, I. K., Chen, S. C., Mukhopadhyay, S., Huang, D. S., Lee, J. H., Tsai, Y. S., Lu, Ryan, He, JunYear:
2018
Language:
english
DOI:
10.1109/IRPS.2018.8353575
File:
PDF, 476 KB
english, 2018