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[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Single pulse short-circuit robustness and repetitive stress aging of GaN GITs
Castellazzi, Alberto, Fayyaz, Asad, Zhu, Siwei, Oeder, Thorsten, Pfost, MartinYear:
2018
Language:
english
DOI:
10.1109/IRPS.2018.8353593
File:
PDF, 1.66 MB
english, 2018