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[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Study of impact of BTI's local layout effect including recovery effect on various standard-cells in 10nm FinFET
Igarashi, Mitsuhiko, Uchida, Yuuki, Takazawa, Yoshio, Tsukamoto, Yasumasa, Shibutani, Koji, Nii, KojiYear:
2018
Language:
english
DOI:
10.1109/IRPS.2018.8353654
File:
PDF, 597 KB
english, 2018