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[ASME ASME 2003 International Electronic Packaging Technical Conference and Exhibition - Maui, Hawaii, USA (Sunday 6 July 2003)] 2003 International Electronic Packaging Technical Conference and Exhibition, Volume 2 - Low Cycle Fatigue in RF Microwave Module Housings
Baughn, Terry V., Chen, SheaYear:
2003
Language:
english
DOI:
10.1115/IPACK2003-35263
File:
PDF, 387 KB
english, 2003