Effect of hot carrier stress on device junctions measured...

Applied Physics Letters 2018 / 06 Vol. 112; Iss. 23

Effect of hot carrier stress on device junctions measured by electron holography and scanning capacitance microscopy

Nxumalo, J., Ioannou, D. P., Katnani, A., Brown, J., Bandy, K., Macdonald, M., Krishnasamy, R., Bruley, J.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
112
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.5009243
Date:
June, 2018
File:
PDF, 1.33 MB
english, 2018
Conversion to is in progress
Conversion to is failed