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Interface characteristics and electrical transport of Ge/Si heterojunction fabricated by low-temperature wafer bonding
Ke, Shaoying, Ye, Yujie, Wu, Jinyong, Lin, Shaoming, Huang, Wei, Li, Cheng, Chen, SongyanLanguage:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/1361-6463/aac7b0
Date:
May, 2018
File:
PDF, 1.31 MB
english, 2018