Interface characteristics and electrical transport of Ge/Si...

  • Main
  • 2018 / 05
  • Interface characteristics and electrical transport of Ge/Si...

Interface characteristics and electrical transport of Ge/Si heterojunction fabricated by low-temperature wafer bonding

Ke, Shaoying, Ye, Yujie, Wu, Jinyong, Lin, Shaoming, Huang, Wei, Li, Cheng, Chen, Songyan
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/1361-6463/aac7b0
Date:
May, 2018
File:
PDF, 1.31 MB
english, 2018
Conversion to is in progress
Conversion to is failed