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[IEEE 2018 IEEE International Conference on Big Data and Smart Computing (BigComp) - Shanghai, China (2018.1.15-2018.1.17)] 2018 IEEE International Conference on Big Data and Smart Computing (BigComp) - Intelligent Fault Detection via Dilated Convolutional Neural Networks
Khan, Mohammad Azam, Kim, Yong-Hwa, Choo, JaegulYear:
2018
Language:
english
DOI:
10.1109/BigComp.2018.00137
File:
PDF, 236 KB
english, 2018