[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - All-digital PLL frequency and phase noise degradation measurements using simple on-chip monitoring circuits
Park, Gyusung, Kim, Minsu, Kim, Chris H., Kim, Bongjin, Reddy, VijayYear:
2018
DOI:
10.1109/IRPS.2018.8353613
File:
PDF, 525 KB
2018