[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Suppression of endurance-stressed data-retention failures of 40nm TaOx-based ReRAM
Fukuyama, Shouhei, Maeda, Kazuki, Matsuda, Shinpei, Takeuchi, Ken, Yasuhara, RyutaroYear:
2018
Language:
english
DOI:
10.1109/IRPS.2018.8353677
File:
PDF, 459 KB
english, 2018