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[IEEE 2018 IEEE 36th VLSI Test Symposium (VTS) - San Francisco, CA, USA (2018.4.22-2018.4.25)] 2018 IEEE 36th VLSI Test Symposium (VTS) - Special session on bringing cores closer together: The wireless revolution in on-chip communication
Mak, Terrence, Matsutani, Hiroki, Pande, Partha PratimYear:
2018
Language:
english
DOI:
10.1109/VTS.2018.8368638
File:
PDF, 110 KB
english, 2018