[IEEE 2018 IEEE 36th VLSI Test Symposium (VTS) - San...

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[IEEE 2018 IEEE 36th VLSI Test Symposium (VTS) - San Francisco, CA, USA (2018.4.22-2018.4.25)] 2018 IEEE 36th VLSI Test Symposium (VTS) - On-line monitoring and error correction in sensor interface circuits using digital calibration techniques

Heinssen, Sascha, Hillebrand, Theodor, Taddiken, Maike, Paul, Steffen, Peters-Drolshagen, Dagmar
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Year:
2018
Language:
english
DOI:
10.1109/VTS.2018.8368652
File:
PDF, 536 KB
english, 2018
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