Learning from a lot: Empirical Bayes for high-dimensional model-based prediction
van de Wiel, Mark A., Te Beest, Dennis E., Münch, Magnus M.Language:
english
Journal:
Scandinavian Journal of Statistics
DOI:
10.1111/sjos.12335
Date:
June, 2018
File:
PDF, 740 KB
english, 2018