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[IEEE 2017 36th Chinese Control Conference (CCC) - Dalian, China (2017.7.26-2017.7.28)] 2017 36th Chinese Control Conference (CCC) - Numerical calculation and analysis of transient enclosure voltage rising caused by operating disconnectors
Fu-cheng, Lang, Hong-kui, Zhang, Xiao-xue, TaiYear:
2017
Language:
english
DOI:
10.23919/ChiCC.2017.8029065
File:
PDF, 117 KB
english, 2017