Atomic Force Microscopy and EDX Analysis for Investigation...

Atomic Force Microscopy and EDX Analysis for Investigation Photoconductive LT-GaAs Terahertz Antennas

Nomoev, Sergey, Vasilevskii, Ivan, Khartaeva, Erzhena
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Volume:
271
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.271.92
Date:
January, 2018
File:
PDF, 974 KB
english, 2018
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