Identification of nanometer-scale compositional...

Identification of nanometer-scale compositional fluctuations in silicate glass using electron microscopy and spectroscopy

Nakazawa, Katsuaki, Miyata, Tomohiro, Amma, Shin-ichi, Mizoguchi, Teruyasu
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Volume:
154
Language:
english
Journal:
Scripta Materialia
DOI:
10.1016/j.scriptamat.2018.05.048
Date:
September, 2018
File:
PDF, 1.39 MB
english, 2018
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