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IEEE Transactions on Instrumentation and Measurement 2018

Modeling and Validation of Fixture-Induced Error for Impedance Measurements

Nelson, Blake W., Lemmon, Andrew N., DeBoi, Brian T., Freeborn, Todd J.
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/TIM.2018.2838858
File:
PDF, 3.07 MB
english, 2018
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