Novel Magnetic Burn-In for Retention and Magnetic Tolerance Testing of STTRAM
Khan, Mohammad Nasim Imtiaz, Iyengar, Anirudh S., Ghosh, SwaroopYear:
2018
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2018.2820508
File:
PDF, 2.54 MB
english, 2018