Low-temperature characteristics of normally-off...

Cryogenics 2018 / 07 Vol. 93

Low-temperature characteristics of normally-off AlGaN/GaN-on-Si gate-recessed MOSHFETs

Keum, Dongmin, Kim, Hyungtak
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Volume:
93
Language:
english
Journal:
Cryogenics
DOI:
10.1016/j.cryogenics.2018.05.009
Date:
July, 2018
File:
PDF, 1.82 MB
english, 2018
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