[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Sub-pJ consumption and short latency time in RRAM arrays for high endurance applications
Sassine, Gilbert, Nail, Cecile, Tillie, Luc, Robayo, Diego Alfaro, Levisse, Alexandre, Cagli, Carlo, Hajjam, Khalil El., Nodin, Jean-Francois, Vianello, Elisa, Bernard, Mathieu, Molas, Gabriel, Nowak,Year:
2018
Language:
english
DOI:
10.1109/IRPS.2018.8353675
File:
PDF, 1.57 MB
english, 2018