![](/img/cover-not-exists.png)
Experimental Study of Damage Mechanism of Carbon Nanotube as Nanocomponent of Electronic Devices Under High Current Density
Sasagawa, Kazuhiko, Fujisaki, Kazuhiro, Unuma, Jun, Azuma, RyotaVolume:
136
Language:
english
Journal:
Journal of Electronic Packaging
DOI:
10.1115/1.4026878
Date:
September, 2014
File:
PDF, 1.43 MB
english, 2014