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[IEEE 2017 IEEE International Integrated Reliability Workshop (IIRW) - Fallen Leaf Lake, CA (2017.10.8-2017.10.12)] 2017 IEEE International Integrated Reliability Workshop (IIRW) - Impact of hot carrier stress on small-signal parameters of FD-SOI NMOSFETs
Chohan, T., Slesazeck, S., Trommer, J., Pesic, M., Lehmann, S., Pakfar, A., Harame, D., Mikolajick, T.Year:
2017
Language:
english
DOI:
10.1109/IIRW.2017.8361240
File:
PDF, 365 KB
english, 2017