[IEEE 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2018.4.16-2018.4.19)] 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - On IC traceability via blockchain
Islam, Md Nazmul, Patii, Vinay C, Kundu, SandipYear:
2018
Language:
english
DOI:
10.1109/VLSI-DAT.2018.8373269
File:
PDF, 596 KB
english, 2018