[IEEE 2018 International Symposium on VLSI Design,...

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[IEEE 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2018.4.16-2018.4.19)] 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - On IC traceability via blockchain

Islam, Md Nazmul, Patii, Vinay C, Kundu, Sandip
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Year:
2018
Language:
english
DOI:
10.1109/VLSI-DAT.2018.8373269
File:
PDF, 596 KB
english, 2018
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