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Scanner path planning with the control of overlap for part inspection with an industrial robot
Phan, Nguyen Duy Minh, Quinsat, Yann, Lavernhe, Sylvain, Lartigue, ClaireLanguage:
english
Journal:
The International Journal of Advanced Manufacturing Technology
DOI:
10.1007/s00170-018-2336-8
Date:
June, 2018
File:
PDF, 5.83 MB
english, 2018