Influence of the gate bias stress on the stability of n-type Organic Field-Effect Transistors based on Dicyanovinylenes-Dihydroindenofluorene semiconductors
Bebiche, Sarah, Cisneros-Perez, Pablo, Mohammed-Brahim, Tayeb, Harnois, Maxime, Rault - Berthelot, Joelle, Poriel, Cyril, Jacques, EmmanuelYear:
2018
Language:
english
Journal:
Materials Chemistry Frontiers
DOI:
10.1039/C8QM00193F
File:
PDF, 1.06 MB
english, 2018