[IEEE 2018 IEEE 36th VLSI Test Symposium (VTS) - San Francisco, CA, USA (2018.4.22-2018.4.25)] 2018 IEEE 36th VLSI Test Symposium (VTS) - Multi-faceted microarchitecture level reliability characterization for NVIDIA and AMD GPUs
Vallero, Alessandro, Tselonis, Sotiris, Gizopoulos, Dimitris, Di Carlo, StefanoYear:
2018
Language:
english
DOI:
10.1109/VTS.2018.8368665
File:
PDF, 596 KB
english, 2018