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Investigation of charge carrier depletion in freestanding nanowires by a multi-probe scanning tunneling microscope
Nägelein, Andreas, Steidl, Matthias, Korte, Stefan, Voigtländer, Bert, Prost, Werner, Kleinschmidt, Peter, Hannappel, ThomasLanguage:
english
Journal:
Nano Research
DOI:
10.1007/s12274-018-2105-x
Date:
June, 2018
File:
PDF, 1.69 MB
english, 2018