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Electrical characterization of low temperature deposited oxide films on ZnO/n-Si substrate
S. K. Nandi, S. Chatterjee, S. K. Samanta, P. K. Bose, C. K. MaitiVolume:
26
Language:
english
Pages:
5
DOI:
10.1007/bf02706765
Date:
December, 2003
File:
PDF, 275 KB
english, 2003