[IEEE 2018 International Conference on Advanced Systems and Electric Technologies (IC_ASET) - Hammamet, Tunisia (2018.3.22-2018.3.25)] 2018 International Conference on Advanced Systems and Electric Technologies (IC_ASET) - New approach to extract palmprint lines
Thamri, Essia, Aloui, Kamel, Naceur, Mohamed SaberYear:
2018
Language:
english
DOI:
10.1109/ASET.2018.8379895
File:
PDF, 280 KB
english, 2018