Proton Radiation Effects on Y-Doped HfO 2 -Based Ferroelectric Memory
Wang, Yan, Huang, Fei, Hu, Yuan, Cao, Rongrong, Shi, Tuo, Liu, Qi, Bi, Lei, Liu, MingVolume:
39
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2018.2831784
Date:
June, 2018
File:
PDF, 1.03 MB
english, 2018