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Effects of the Grain Boundary and Interface Traps on the Electrical Characteristics of 3D NAND Flash Memory Devices
Lee, Jun Gyu, Kim, Tae WhanVolume:
18
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2018.15000
Date:
March, 2018
File:
PDF, 525 KB
english, 2018