Effects of the Grain Boundary and Interface Traps on the...

Effects of the Grain Boundary and Interface Traps on the Electrical Characteristics of 3D NAND Flash Memory Devices

Lee, Jun Gyu, Kim, Tae Whan
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Volume:
18
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2018.15000
Date:
March, 2018
File:
PDF, 525 KB
english, 2018
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