ChemInform Abstract: X-RAY DIFFRACTION TOPOGRAPHY AND CRYSTAL CHARACTERIZATION OF GALLIUM NITRIDE EPITAXIAL LAYERS FOR LIGHT-EMITTING DIODES
SHINTANI, A., TAKANO, Y., MINAGAWA, S., MAKI, M.Volume:
10
Journal:
Chemischer Informationsdienst
DOI:
10.1002/chin.197913003
Date:
March, 1979
File:
PDF, 106 KB
1979