System-level Read Disturb Suppression Techniques of TLC NAND Flash Memories for Read-Hot/Cold Data Mixed Applications
Watanabe, Hikaru, Deguchi, Yoshiaki, Kobayashi, Atsuro, Matsui, Chihiro, Takeuchi, KenLanguage:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2018.05.004
Date:
June, 2018
File:
PDF, 1.55 MB
english, 2018