How test suites impact fault localisation starting from the size
Lei, Yan, Sun, Chengnian, Mao, Xiaoguang, Su, ZhendongVolume:
12
Language:
english
Journal:
IET Software
DOI:
10.1049/iet-sen.2017.0026
Date:
June, 2018
File:
PDF, 1.85 MB
english, 2018