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[IEEE 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2018.4.16-2018.4.19)] 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - A learning-based methodology for routability prediction in placement
Chen, Li-Chin, Huang, Chien-Chia, Chang, Yao-Lin, Chen, Hung-MingYear:
2018
Language:
english
DOI:
10.1109/VLSI-DAT.2018.8373272
File:
PDF, 576 KB
english, 2018