[IEEE 2018 Design, Automation & Test in Europe...

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[IEEE 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dresden, Germany (2018.3.19-2018.3.23)] 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Three years of low-power image recognition challenge: Introduction to special session

Gauen, Kent, Dailey, Ryan, Lu, Yung-Hsiang, Park, Eunbyung, Liu, Wei, Berg, Alexander C., Chen, Yiran
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Year:
2018
Language:
english
DOI:
10.23919/DATE.2018.8342099
File:
PDF, 120 KB
english, 2018
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