![](/img/cover-not-exists.png)
[IEEE 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dresden, Germany (2018.3.19-2018.3.23)] 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Three years of low-power image recognition challenge: Introduction to special session
Gauen, Kent, Dailey, Ryan, Lu, Yung-Hsiang, Park, Eunbyung, Liu, Wei, Berg, Alexander C., Chen, YiranYear:
2018
Language:
english
DOI:
10.23919/DATE.2018.8342099
File:
PDF, 120 KB
english, 2018