[IEEE 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dresden, Germany (2018.3.19-2018.3.23)] 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Program error rate-based wear leveling for NAND flash memory
Shi, Xin, Wu, Fei, Wang, Shunzhuo, Xie, Changsheng, Lu, ZhonghaiYear:
2018
Language:
english
DOI:
10.23919/DATE.2018.8342205
File:
PDF, 192 KB
english, 2018