New NBTI models for degradation and relaxation kinetics...

Microelectronics Reliability 2018 / 08 Vol. 87

New NBTI models for degradation and relaxation kinetics valid over extended temperature and stress/recovery ranges

Nouguier, D., Federspiel, X., Ghibaudo, G., Rafik, M., Roy, D.
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Volume:
87
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.04.009
Date:
August, 2018
File:
PDF, 2.66 MB
english, 2018
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