Scanning X-ray microscopy with large solid angle X-ray...

Journal of Instrumentation 2018 / 05 Vol. 13; Iss. 5

Scanning X-ray microscopy with large solid angle X-ray fluorescence detection at the XUV beamline P04, DESY

Andrianov, K., Haidl, A., Lühl, L., Dehlinger, A., Dierks, H., Gnewkow, R., Nisius, T., Kanngießer, B., Wilhein, T.
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Volume:
13
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/13/05/C05013
Date:
May, 2018
File:
PDF, 2.05 MB
english, 2018
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