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[IEEE 2017 IEEE 17th International Conference on Communication Technology (ICCT) - Chengdu, China (2017.10.27-2017.10.30)] 2017 IEEE 17th International Conference on Communication Technology (ICCT) - Using VNA to test the PCB impedence
Liu, Dan, Li, Shubiao, Yuan, GuopingYear:
2017
Language:
english
DOI:
10.1109/ICCT.2017.8359784
File:
PDF, 740 KB
english, 2017