[IEEE 2018 International Symposium on VLSI Design,...

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[IEEE 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2018.4.16-2018.4.19)] 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - A cuffless wearable system for real-time cutaneous pressure monitoring with cloud computing assistance

Yeh, Kun-Ying, Lin, Ting-Hao, Hsieh, Yi-Yen, Chang, Chia-Ming, Yang, Yao-Joe, Lu, Shey-Shi
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Year:
2018
Language:
english
DOI:
10.1109/VLSI-DAT.2018.8373251
File:
PDF, 1.02 MB
english, 2018
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