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[IEEE 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2018.4.16-2018.4.19)] 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - High-throughput Von Neumann post-processing for random number generator
Zhang, Ruilin, Chen, Sijia, Wan, Chao, Shinohara, HirofumiYear:
2018
Language:
english
DOI:
10.1109/VLSI-DAT.2018.8373253
File:
PDF, 685 KB
english, 2018