A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application
Yan, Aibin, Yang, Kang, Huang, Zhengfeng, Zhang, Jiliang, Cui, Jie, Fang, Xiangsheng, Yi, Maoxiang, Wen, XiaoqingYear:
2018
Language:
english
Journal:
IEEE Transactions on Circuits and Systems II: Express Briefs
DOI:
10.1109/TCSII.2018.2849028
File:
PDF, 346 KB
english, 2018