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An optimal model using data envelopment analysis for uncertainty metrics in reliability
Zu, Tianpei, Kang, Rui, Wen, Meilin, Yang, YiLanguage:
english
Journal:
Soft Computing
DOI:
10.1007/s00500-018-3329-0
Date:
June, 2018
File:
PDF, 578 KB
english, 2018