Using Pattern Classification to Measure Adaptation to the...

Using Pattern Classification to Measure Adaptation to the Orientation of High Order Aberrations

Sawides, Lucie, Dorronsoro, Carlos, Haun, Andrew M., Peli, Eli, Marcos, Susana, Solomon, Samuel G.
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Volume:
8
Language:
english
Journal:
PLoS ONE
DOI:
10.1371/journal.pone.0070856
Date:
August, 2013
File:
PDF, 3.01 MB
english, 2013
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