Study of Elastic Moduli of Semiconductors with Defects by...

Study of Elastic Moduli of Semiconductors with Defects by the Statistical Moment Method

Hung, Vu Van, Thanh, Le Dai, Huong, Ngo Thu
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Volume:
9
Year:
2011
Language:
english
Journal:
e-Journal of Surface Science and Nanotechnology
DOI:
10.1380/ejssnt.2011.499
File:
PDF, 150 KB
english, 2011
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