X-ray diffraction study of Ge-Bi-Te mixed-layer ternary...

Inorganic Materials 2000 / 11 Vol. 36; Iss. 11

X-ray diffraction study of Ge-Bi-Te mixed-layer ternary compounds

O. G. Karpinskii, L. E. Shelimova, M. A. Kretova, V. S. Zemskov
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Volume:
36
Language:
english
Pages:
6
DOI:
10.1007/bf02758926
Date:
November, 2000
File:
PDF, 382 KB
english, 2000
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