Improved resistance to electromigration and...

Improved resistance to electromigration and acoustomigration of Al interdigital transducers by Ni underlayer

Li, Qi, Fu, Su-Lei, Song, Cheng, Wang, Guang-Yue, Zeng, Fei, Pan, Feng
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Language:
english
Journal:
Rare Metals
DOI:
10.1007/s12598-018-1050-x
Date:
May, 2018
File:
PDF, 1.69 MB
english, 2018
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