![](/img/cover-not-exists.png)
Low frequency noise analysis of LT-GaAs and LT-Al0.3Ga0.7As MISFET active layers
Rao, R.V.V.V.J., Chong, T.C., Lau, W.S., Tan, L.S., Geng, C., Lim, N.Volume:
34
Year:
1998
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:19981393
File:
PDF, 309 KB
english, 1998