A novel analysis method to determine the surface...

A novel analysis method to determine the surface recombination velocities on unequally passivated surfaces of a silicon wafer by the short wavelength spectrum excited quasi-steady-state photoconductance measurement

Wei, Yi, Lin, Yiren, Yang, Xichuan, Tan, Xin, Su, Jia, Song, Chengyuan, Liu, Aimin
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Volume:
8
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.5035503
Date:
June, 2018
File:
PDF, 2.90 MB
english, 2018
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