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A Statistic-based Scan Chain Reordering for Energy-Quality Scalable Scan Test
Seo, Sungyoul, Cho, Keewon, Lee, Young-woo, Kang, SunghoYear:
2018
Language:
english
Journal:
IEEE Journal on Emerging and Selected Topics in Circuits and Systems
DOI:
10.1109/JETCAS.2018.2833846
File:
PDF, 1.19 MB
english, 2018